High‐Reliability Simulation for Prediction Water Vapor Barrier Performance in Thin Film Encapsulation with Broad Application Potential

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Xianwen Liu, Tao Sun, Xuyang Li, Bin Liu, Qi Yao, Shuo Zhang, Feng Wang, Tao Wang, Rui Hong, Zhinong Yu
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	physica status solidi (a)
Online Access:	Acceder al recurso
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