24‐1: Exploring the Aging Phenomenon in Quantum Dot Light‐Emitting Diodes from the Perspective of Individual Quantum Dot Aging
Fuente:
Wiley Open Access
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Artículo Open Access |
| Veröffentlicht: |
Wiley
2024
|
| Schlagworte: | |
| Online-Zugang: | |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| _version_ | 1867019056301735936 |
|---|---|
| author | Mi Gu Jingrui Ma Jiahao Wei Xiao Wei Sun |
| author_facet | Mi Gu Jingrui Ma Jiahao Wei Xiao Wei Sun Mi Gu Jingrui Ma Jiahao Wei Xiao Wei Sun |
| collection | Wiley Open Access |
| contents | 24‐1: Exploring the Aging Phenomenon in Quantum Dot Light‐Emitting Diodes from the Perspective of Individual Quantum Dot Aging Mi Gu Jingrui Ma Jiahao Wei Xiao Wei Sun SID Symposium Digest of Technical Papers Quantum Dot Light Emitting Diodes (QLEDs) have emerged as preeminent applications within the realm of quantum dot technologies. Despite their undeniable success, challenges persist in the form of issues related to device stability and controllability. The conventional approach to device aging analysis predominantly concentrates on the holistic evaluation of the entire device. However, the intricate interaction of numerous factors influencing aging renders this conventional analysis notably intricate. This study endeavors to scrutinize the aging mechanism inherent to QLEDs, employing single quantum dot measurement technology for a nuanced and independent analysis of various contributing factors. This passage principally concentrates on the characterization and analysis of the photodegradation of individual quantum dots, with a specific emphasis on the aging process induced by laser irradiation. 10.1002/sdtp.17039 http://onlinelibrary.wiley.com/termsAndConditions#vor |
| doi_str_mv | 10.1002/sdtp.17039 |
| format | Artículo Open Access |
| id | wiley_oa_10_1002_sdtp_17039 |
| institution | Wiley Open Access |
| license_str_mv | http://onlinelibrary.wiley.com/termsAndConditions#vor |
| publishDate | 2024 |
| publisher | Wiley |
| record_format | wiley_oa |
| spellingShingle | 24‐1: Exploring the Aging Phenomenon in Quantum Dot Light‐Emitting Diodes from the Perspective of Individual Quantum Dot Aging Mi Gu Jingrui Ma Jiahao Wei Xiao Wei Sun SID Symposium Digest of Technical Papers 24‐1: Exploring the Aging Phenomenon in Quantum Dot Light‐Emitting Diodes from the Perspective of Individual Quantum Dot Aging Mi Gu Jingrui Ma Jiahao Wei Xiao Wei Sun SID Symposium Digest of Technical Papers Quantum Dot Light Emitting Diodes (QLEDs) have emerged as preeminent applications within the realm of quantum dot technologies. Despite their undeniable success, challenges persist in the form of issues related to device stability and controllability. The conventional approach to device aging analysis predominantly concentrates on the holistic evaluation of the entire device. However, the intricate interaction of numerous factors influencing aging renders this conventional analysis notably intricate. This study endeavors to scrutinize the aging mechanism inherent to QLEDs, employing single quantum dot measurement technology for a nuanced and independent analysis of various contributing factors. This passage principally concentrates on the characterization and analysis of the photodegradation of individual quantum dots, with a specific emphasis on the aging process induced by laser irradiation. 10.1002/sdtp.17039 http://onlinelibrary.wiley.com/termsAndConditions#vor |
| title | 24‐1: Exploring the Aging Phenomenon in Quantum Dot Light‐Emitting Diodes from the Perspective of Individual Quantum Dot Aging |
| topic | SID Symposium Digest of Technical Papers |
| url | https://sid.onlinelibrary.wiley.com/doi/10.1002/sdtp.17039 |