29‐3: Improving Lateral Leakage Current in OLED Pixels by New Hole Transport Materials: Resolving the Crosstalk Issue

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	You-Hyun Kim, Leo Weegels, Christian Eickhoff, Falk May, Jens Engelhart, Sebastian Meyer, Michele Ricks, Joachim Kaiser
Format:	Artículo Open Access
Published:	Wiley 2024
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
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