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30‐3: Direct Observation of 2 Delta L in a‐IGZO TFT Using Scanning Capacitance Microscopy

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Hyunsoo Lee, Woo-Geun Lee, Yu-Jin Kim, Kangnam Kim, Songhee Kim, Seongyeol Syn, Beom Jun Kim, Kapsoo Yoon
Format:	Artículo Open Access
Published:	Wiley 2024
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
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