Yun, S. S., Park, J., Seo, J., Kim, S., & Kang, T. (2024). 48‐1: A Data‐Driven Intelligent Stress Monitoring for a Robust Manufacturing of a Phone Display with the Extremely Narrow Bottom Bezel. Wiley. https://doi.org/10.1002/sdtp.17606
Citazione stile Chigago Style (17a edizione)Yun, Sung Sik, Joonho Park, Juyeon Seo, Seokhwan Kim, e Taewook Kang. 48‐1: A Data‐Driven Intelligent Stress Monitoring for a Robust Manufacturing of a Phone Display with the Extremely Narrow Bottom Bezel. Wiley, 2024. https://doi.org/10.1002/sdtp.17606.
Citatione MLA (9a ed.)Yun, Sung Sik, et al. 48‐1: A Data‐Driven Intelligent Stress Monitoring for a Robust Manufacturing of a Phone Display with the Extremely Narrow Bottom Bezel. Wiley, 2024. https://doi.org/10.1002/sdtp.17606.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.