84‐3: Breakthrough for Test Cost Reduction on Micro‐LED Device with High Parallel Single Insertion Testing of Electric‐Luminescence including External Quantum Efficiency and Electrical Test
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| Natura: | Artículo Open Access |
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Wiley
2024
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| _version_ | 1867006226456379392 |
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| author | Kotaro Hasegawa Koji Miyauchi Hiroshi Kaga |
| author_facet | Kotaro Hasegawa Koji Miyauchi Hiroshi Kaga Kotaro Hasegawa Koji Miyauchi Hiroshi Kaga |
| collection | Wiley Open Access |
| contents | 84‐3: Breakthrough for Test Cost Reduction on Micro‐LED Device with High Parallel Single Insertion Testing of Electric‐Luminescence including External Quantum Efficiency and Electrical Test Kotaro Hasegawa Koji Miyauchi Hiroshi Kaga SID Symposium Digest of Technical Papers The biggest challenge in launching Micro‐LED displays is cost reduction. In our previous report (1), we proposed a super cost‐effective test method embedding EL and electrical testing (PEMP TM ). In this paper, we report the validity of PEMP TM by comparing the external quantum efficiency (EQE) of LED emission and photodetection characteristics. 10.1002/sdtp.17749 http://onlinelibrary.wiley.com/termsAndConditions#vor |
| doi_str_mv | 10.1002/sdtp.17749 |
| format | Artículo Open Access |
| id | wiley_oa_10_1002_sdtp_17749 |
| institution | Wiley Open Access |
| license_str_mv | http://onlinelibrary.wiley.com/termsAndConditions#vor |
| publishDate | 2024 |
| publisher | Wiley |
| record_format | wiley_oa |
| spellingShingle | 84‐3: Breakthrough for Test Cost Reduction on Micro‐LED Device with High Parallel Single Insertion Testing of Electric‐Luminescence including External Quantum Efficiency and Electrical Test Kotaro Hasegawa Koji Miyauchi Hiroshi Kaga SID Symposium Digest of Technical Papers 84‐3: Breakthrough for Test Cost Reduction on Micro‐LED Device with High Parallel Single Insertion Testing of Electric‐Luminescence including External Quantum Efficiency and Electrical Test Kotaro Hasegawa Koji Miyauchi Hiroshi Kaga SID Symposium Digest of Technical Papers The biggest challenge in launching Micro‐LED displays is cost reduction. In our previous report (1), we proposed a super cost‐effective test method embedding EL and electrical testing (PEMP TM ). In this paper, we report the validity of PEMP TM by comparing the external quantum efficiency (EQE) of LED emission and photodetection characteristics. 10.1002/sdtp.17749 http://onlinelibrary.wiley.com/termsAndConditions#vor |
| title | 84‐3: Breakthrough for Test Cost Reduction on Micro‐LED Device with High Parallel Single Insertion Testing of Electric‐Luminescence including External Quantum Efficiency and Electrical Test |
| topic | SID Symposium Digest of Technical Papers |
| url | https://sid.onlinelibrary.wiley.com/doi/10.1002/sdtp.17749 |