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P‐12: Improve the Reliability of a‐IGZO TFT through Optimizing the Threshold Voltage and Channel Thickness in AMOLED Hybrid Backplane

Fuente: Wiley Open Access

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Détails bibliographiques
Auteurs principaux:	Dongliang Yu, Ying Shen, Yunhai Wan, Wenzhi Fan, Weibin Zhang
Format:	Artículo Open Access
Publié:	Wiley 2024
Sujets:	SID Symposium Digest of Technical Papers
Accès en ligne:	Acceder al recurso
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