P‐12: Improve the Reliability of a‐IGZO TFT through Optimizing the Threshold Voltage and Channel Thickness in AMOLED Hybrid Backplane

Fuente: Wiley Open Access
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Bibliographic Details
Main Authors: Dongliang Yu, Ying Shen, Yunhai Wan, Wenzhi Fan, Weibin Zhang
Format: Artículo Open Access
Published: Wiley 2024
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