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P‐266: Late‐News Poster: Quality Assessment Towards Reflective Pattern Based on Diffraction Appearance

Fuente: Wiley Open Access

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Detalles Bibliográficos
Autores principales:	Soyoung Kwon, Wooyoung Cheon, Sumi Lee, Youngjun Seo, Jaejoong Kwon, Yongjo Kim
Formato:	Artículo Open Access
Publicado:	Wiley 2024
Materias:	SID Symposium Digest of Technical Papers
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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