28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode

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Bibliographic Details
Main Authors:	Ya-Ru Yang, En Tsung, Ya-Hsiang Tai, Yao-Chung Chang, Chih-Chang Lai, Ching-Chun Lin
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
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