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Bibliographic Details
Main Authors:	I. Knausz, J. Wan, C. Verreen, B. Raymond, T. Weeks, A. Pearson, N. Rivers, T. Daniels, G. Bradshaw, C. Meyer, N. Cannon, N. Jain, C. Prevatte, E. Radauscher, M.A. Meitl, C.A. Bower
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	https://sid.onlinelibrary.wiley.com/doi/10.1002/sdtp.18256
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