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| Autori principali: | , , , , , , , , , , , , |
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| Natura: | Artículo Open Access |
| Pubblicazione: |
Wiley
2025
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| Soggetti: | |
| Accesso online: | https://sid.onlinelibrary.wiley.com/doi/10.1002/sdtp.18445 |
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Sommario:
- 99‐4: Dynamic X‐ray Flat Panel Detector with High Imaging Quality Based on Amorphous Silicon PIN Photodiode Yue Geng Fengchun Pang Yong Zhang Jinyu Li Zhenxing Ming Qingxin Du Liangjie Li Guan Zhang Rongxin Wang Zhi Ding Kai Yang Chuncheng Che Xuecheng Hou SID Symposium Digest of Technical Papers X‐ray flat panel detectors based on TFT are widely used in the fields of medical digital imaging and industrial inspection. This paper is based on the a‐Si TFT+PIN detection panels. Dynamic detection is achieved by high thickness PIN, and low noise is realized simultaneously. On this basis, we start from the principle of lag generation and design new pixel structure and process. Ultimately, dynamic detection with low lag is achieved. 10.1002/sdtp.18445 http://onlinelibrary.wiley.com/termsAndConditions#vor