P‐229: Late‐News Poster: Improved PBTS Reliability of Dual‐Gate a‐IGZO TFT by Bottom Interface Optimization

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Hanpeng Deng, Yuanpeng Chen, Xingyu Zhou, Wei Wang, Yanqing Guan, Chao Dai, Ming-Chou Wu
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
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