P‐45: Development of an AI Model for Defect Detection Considering Manufacturing Variability

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Choongmin Jeong, Kyujin Cho, Joohyun Kang, Byongug Park, Kyoungah Lee, Hyunjoon Kim, Seungin Baek
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
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