24‐1: AI‐based Rapid Defect Detection Method for Display Screen Appearance

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Shujuan Yin, Yuyu Liu, Xingqun Jiang
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
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