44‐2: Analysis of failure model for notebook mechanical tests

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Guoren Luo, Ji Li, Yongchao Zhao, Jie Chen, Chunliu Yang, Xiao Liu
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
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Description
DOI:	10.1002/sdtp.18812

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