Copertina

44‐2: Analysis of failure model for notebook mechanical tests

Fuente: Wiley Open Access

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Dettagli Bibliografici
Autori principali:	Guoren Luo, Ji Li, Yongchao Zhao, Jie Chen, Chunliu Yang, Xiao Liu
Natura:	Artículo Open Access
Pubblicazione:	Wiley 2025
Soggetti:	SID Symposium Digest of Technical Papers
Accesso online:	Acceder al recurso
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