55‐1: Invited Paper: Study on Intrinsic and Extrinsic OLED Degradation by Utilizing μ‐PL with Gradient Shaping Preparation and GCIB‐XPS/REELS
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| Format: | Artículo Open Access |
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Wiley
2025
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| _version_ | 1867002943099633664 |
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| author | Takahiro Ikarashi Shunnosuke, Okino Daichi Shirakura Hiroshi Fujimoto Hikaru Takano Takahiro Shibamori Takashi Miyamoto Kentaro Harada |
| author_facet | Takahiro Ikarashi Shunnosuke, Okino Daichi Shirakura Hiroshi Fujimoto Hikaru Takano Takahiro Shibamori Takashi Miyamoto Kentaro Harada Takahiro Ikarashi Shunnosuke, Okino Daichi Shirakura Hiroshi Fujimoto Hikaru Takano Takahiro Shibamori Takashi Miyamoto Kentaro Harada |
| collection | Wiley Open Access |
| contents | 55‐1: Invited Paper: Study on Intrinsic and Extrinsic OLED Degradation by Utilizing μ‐PL with Gradient Shaping Preparation and GCIB‐XPS/REELS Takahiro Ikarashi Shunnosuke, Okino Daichi Shirakura Hiroshi Fujimoto Hikaru Takano Takahiro Shibamori Takashi Miyamoto Kentaro Harada SID Symposium Digest of Technical Papers We demonstrate analysis of phosphorescent organic light‐emitting diode (OLED) degradation by utilizing micro‐photoluminescence spectroscopy (μ‐PL) combined with gradient shaping preparation. We also discuss on the degradation mechanism by utilizing X‐ray photoemission spectroscopy (XPS) and reflected electron energy loss spectroscopy (REELS) combined with gas cluster ion beam (GCIB) depth profiling. These methodologies provide us with valuable insights such as intrinsic degradation of the electron blocking interface through device operation and extrinsic degradation due to contamination of an acceptor material by a brominated compound. 10.1002/sdtp.18839 http://onlinelibrary.wiley.com/termsAndConditions#vor |
| doi_str_mv | 10.1002/sdtp.18839 |
| format | Artículo Open Access |
| id | wiley_oa_10_1002_sdtp_18839 |
| institution | Wiley Open Access |
| license_str_mv | http://onlinelibrary.wiley.com/termsAndConditions#vor |
| publishDate | 2025 |
| publisher | Wiley |
| record_format | wiley_oa |
| spellingShingle | 55‐1: Invited Paper: Study on Intrinsic and Extrinsic OLED Degradation by Utilizing μ‐PL with Gradient Shaping Preparation and GCIB‐XPS/REELS Takahiro Ikarashi Shunnosuke, Okino Daichi Shirakura Hiroshi Fujimoto Hikaru Takano Takahiro Shibamori Takashi Miyamoto Kentaro Harada SID Symposium Digest of Technical Papers 55‐1: Invited Paper: Study on Intrinsic and Extrinsic OLED Degradation by Utilizing μ‐PL with Gradient Shaping Preparation and GCIB‐XPS/REELS Takahiro Ikarashi Shunnosuke, Okino Daichi Shirakura Hiroshi Fujimoto Hikaru Takano Takahiro Shibamori Takashi Miyamoto Kentaro Harada SID Symposium Digest of Technical Papers We demonstrate analysis of phosphorescent organic light‐emitting diode (OLED) degradation by utilizing micro‐photoluminescence spectroscopy (μ‐PL) combined with gradient shaping preparation. We also discuss on the degradation mechanism by utilizing X‐ray photoemission spectroscopy (XPS) and reflected electron energy loss spectroscopy (REELS) combined with gas cluster ion beam (GCIB) depth profiling. These methodologies provide us with valuable insights such as intrinsic degradation of the electron blocking interface through device operation and extrinsic degradation due to contamination of an acceptor material by a brominated compound. 10.1002/sdtp.18839 http://onlinelibrary.wiley.com/termsAndConditions#vor |
| title | 55‐1: Invited Paper: Study on Intrinsic and Extrinsic OLED Degradation by Utilizing μ‐PL with Gradient Shaping Preparation and GCIB‐XPS/REELS |
| topic | SID Symposium Digest of Technical Papers |
| url | https://sid.onlinelibrary.wiley.com/doi/10.1002/sdtp.18839 |