Image de couverture de livre

P‐1.5: Thermal Stability of Short‐Channel Elevated‐Metal Metal‐Oxide Thin‐Film Transistors

Fuente: Wiley Open Access

Enregistré dans:

Détails bibliographiques
Auteurs principaux:	Yujie Jiang, Nannan Lv, Dongli Zhang, Mingxiang Wang
Format:	Artículo Open Access
Publié:	Wiley 2025
Sujets:	SID Symposium Digest of Technical Papers
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

Documents similaires

P‐22: Fabrication of Ultra Short Channel Oxide Thin Film Transistors
par: Jiangbo Yao, et autres
Publié: (2024)

1‐1: Oxide Semiconductor Thin‐Film Transistors with High Mobility and Stability
par: Guowen Yan, et autres
Publié: (2024)

P‐17: Development of Vertical Oxide Channel Thin Film Transistor Based on Hard‐Mask Etching
par: Binbin Tong, et autres
Publié: (2024)

P‐1.20: Investigation of Illumination and Temperature on the Stability of Indium‐Gallium‐Zinc‐Oxide Thin‐Film Transistors
par: Yuli He, et autres
Publié: (2025)

P‐221: All Inkjet‐Printed Inverted Electroluminescent Quantum Dot Light Emitting Diode Display Based on Metal Oxide Thin Film Transistors
par: Jiyoon Kim, et autres
Publié: (2024)

17‐1: Persistent Photoconductivity Suppression in Amorphous Oxide Thin‐Film Transistors with Double‐Stacked Channel Layers
par: Liangdong Li, et autres
Publié: (2024)

P‐1.34: Recent Developments in Vertial Amorphous Oxide Semiconductor (AOS) Thin‐Film Transistor (TFT) Devices
par: Qianqian Bu, et autres
Publié: (2025)

P‐1.25: Non‐Volatile Charge Trap Memory Transistor Employing Indium Tungsten Oxide Thin Film as Active Channel and Charge Trap Layer
par: RuiPeng Shen, et autres
Publié: (2025)

P‐10.7: Mini/MicroLED Pixel Circuit Based on High mobility Metal Oxide Thin‐Film Transistor Using Pulse Width and Pulse Amplitude Hybrid Modulation
par: Yanrui Lin, et autres
Publié: (2025)

P‐1.13: Electrical Performance of Side Wrapped Thin Film Transistor
par: Zhuang Li, et autres
Publié: (2024)

P‐1.20: Stability of Hydrogenated Amorphous Silicon Thin‐Film Transistors in High‐Brightness Liquid Crystal Displays
par: ZhiXin Sun, et autres
Publié: (2024)

20‐1: Influence of Tungsten Doping Content on the Reliability of Indium Zinc Oxide Thin‐Film Transistors
par: Bin Wang, et autres
Publié: (2025)

63‐2: Metal Oxide Thin‐Film Transistors‐Based Pixel Circuit with Progressive Emission Using Pulse Width Modulation for Micro Light‐Emitting Diode Displays
par: Eun Kyo Jung, et autres
Publié: (2024)

P‐68: Oxide Semiconductor Thin‐Film Transistor‐Based Micro‐LED Pixel Circuit with External Current Setting System
par: Hye-Won Woo, et autres
Publié: (2024)

4‐4: Finetuning the Microstructure of Metal‐Oxide Targets to Optimize Sputter Behavior for Thin Films in TFT
par: E. Franzke, et autres
Publié: (2025)

P‐1.5: Influence of Bandgap of SiN x Gate Insulator on the Degradation Behavior of Amorphous Silicon Thin‐Film Transistors under Reliability Test
par: Xiaoliang Zhou, et autres
Publié: (2024)

P‐1.1: The Back‐channel Effect in Low Temperature Poly‐Si Thin Film Transistors
par: Ying Shen, et autres
Publié: (2024)

P‐1.11: Back‐End‐of‐Line Compatible Al‐doped Indium Zinc Oxide Transistors with Excellent Thermal Stability
par: Jingye Xie, et autres
Publié: (2024)

51‐1: Invited Paper: Optimizing Photonic Annealing Technique for Full‐Solution‐Processed Oxide Thin Film Transistor
par: Meng Xu, et autres
Publié: (2024)

P‐15.25: Study on Stability of Fine Metal Mask
par: Gongzheng Zang, et autres
Publié: (2024)

P‐159: High Performance, Flexible Ferroelectric Thin Film Transistor on PI Substrate
par: Samiran Roy, et autres
Publié: (2025)

P‐1.21: Enhancing the Electrical Performance of ITZO Thin‐Film Transistors with IZO Modified Layer
par: Xi Zhang, et autres
Publié: (2025)

P‐25: Tailoring the Threshold Voltage Control of Oxide Thin‐Film Transistor by Controlling Electron Injection using PN Semiconductor Heterojunction Structure
par: Jung Hoon Han, et autres
Publié: (2024)

P‐7.12: High on‐off ratio and Stability Indium Oxide Thin‐film Transistor with Praseodymium and Hetero‐valence molybdenum doping
par: Honglong Ning, et autres
Publié: (2025)

74‐3: Invited Paper: Polycrystalline Indium Oxide Thin‐Film Transistors formed by Solid‐Phase Crystallization
par: Mamoru Furuta, et autres
Publié: (2025)

11‐3: Positive Shift of the Turn‐On Voltage of Indium‐Gallium‐Zinc Oxide Thin‐Film Transistors with Reduced Active Layer Thickness
par: Runxiao Shi, et autres
Publié: (2025)

P‐1.23: High‐Performance Dual‐Gate a‐IGZO/a‐IZO Thin‐Film Transistors
par: Huan Yang, et autres
Publié: (2024)

P‐1.9: Enhanced Stability Under Positive Bias Temperature Stress of Ln‐Doped InZnO Thin Film Transistors Fabricated with Back‐channel‐etch Structure
par: Juncheng Xiao, et autres
Publié: (2024)

70‐3: Distinguished Student Paper: Hydrogen‐free Oxide Thin‐Film Transistor Toward Resolving Hydrogen‐Associated Instability
par: Mamoru Furuta, et autres
Publié: (2025)

P‐1.6: Junction Resistance and Junction Diffusion Depth in InGaZnO‐based Thin Film Transistors (TFTs) with Thermally induced Source/Drain Region
par: Zhichao Zhou, et autres
Publié: (2024)

P‐1.12: Sub‐200nm Nano‐scale Indium‐Zinc‐Oxide Ultra‐thin Channel Transistors
par: Minghe Zhang, et autres
Publié: (2024)

P‐11.16: Investigation of Light Leakage on the Thin‐Film‐Transistors Depending on the Micro‐LED Backplane Structures
par: Peixuan Chen, et autres
Publié: (2024)

38‐4: Dynamic On‐State Stress‐Induced Degradation in Polycrystalline Silicon Thin‐Film Transistors
par: Yunyang Wang, et autres
Publié: (2025)

P‐1.26: Enhancing the Photoresponse of InZnO Thin‐Film Transistors via Perovskite Coating and Electrode Material Optimization
par: Minjun Zhang, et autres
Publié: (2025)

P‐1.38: Mobility Enhancement in Dual‐Gate a‐IZO Thin‐Film Transistors through Low‐Pressure Oxygen Annealing
par: Yuhan Zhang, et autres
Publié: (2025)

9‐2: Compact Model for Thin‐Film Transistors with Capacitance Frequency Dispersion
par: Pujian Lin, et autres
Publié: (2024)

69‐2: Organic Thin‐Film Transistor Formulations Proven in Mass Production
par: Stephen Bain, et autres
Publié: (2025)

P‐15.15: Improvement of a‐IGZO TFTs Electrical Characteristics for Short Channel TFTs
par: Ming Wang, et autres
Publié: (2024)

35‐4: High‐Mobility and High‐Negative Bias Illumination Stress Stability Based on ITZO/IGZO Bilayer Thin Film Transistors
par: Li Ting, et autres
Publié: (2024)

P‐1.18: Analysis of Hump Characteristic under Positive Bias Temperature Stress in Amorphous InGaZnO Thin‐Film Transistors
par: Xiaoliang Zhou, et autres
Publié: (2025)