P‐1.9: The degradation behavior of oxide devices during environmental reliability test and their rapid recurrences by current impact

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Hao Long, Hang Wang, Shuaiyi Wang, Zhongjie Liu, Shan Li, Charles, Zui Wang, Juncheng Xiao
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
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