P‐1.23: Reliability Analysis of IGZO‐TFT in X‐ray Imaging Detection Technology

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Wei Guo, Zhe Dong, Qibin Feng, Zi Wang, Guoqiang Lv
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
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Description
DOI:	10.1002/sdtp.18928

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