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P‐19.8: Highly Reliable BCE Structured IGZO Thin‐film Transistors for Automotive LCD Applications

Fuente: Wiley Open Access

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Detalles Bibliográficos
Autores principales:	Chenjing Xu, Pan Tian, Yuan Ding, Feng Qin
Formato:	Artículo Open Access
Publicado:	Wiley 2025
Materias:	SID Symposium Digest of Technical Papers
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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