Depth profile study of LaAl 1‐x Cr x O 3 /SrTiO 3 ( x = 0, 0.2, 0.6, and 1) using time of flight secondary ion mass spectrometry (TOF‐SIMS)

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Bibliographic Details
Main Authors:	Manas Kumar Dalai, Gupteswar Samal, Trupti R. Das, Pramod Kumar, Geetanjali Sehgal, Anjana Dogra
Format:	Artículo Open Access
Published:	Wiley 2024
Subjects:	Surface and Interface Analysis
Online Access:	Acceder al recurso
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