A spectroscopic ellipsometry study of TiO 2 :ZrO 2 on TiN/Si thin films prepared by Chemical Beam Vapor Deposition

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Pratiksha Agnihotri, Aman Verma, Anjali Saini, Rashmi Rani, William Maudez, Estelle Wagner, Giacomo Benvenuti, Chandan Banerjee, Mrinal Dutta, Radheshyam Rai
Format:	Artículo Open Access
Published:	Wiley 2024
Subjects:	Surface and Interface Analysis
Online Access:	Acceder al recurso
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