A New XPS Test Material for More Reliable Analysis of Microstructures

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Jörg M. Stockmann, Jörg Radnik, Sebastian Bütefisch, Thomas Weimann, Vasile‐Dan Hodoroaba
Format:	Artículo Open Access
Published:	Wiley 2024
Subjects:	Surface and Interface Analysis
Online Access:	Acceder al recurso
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