Gorbach, T., Carpenter, J. R., Frost, C., Josefsson, M., Nicholas, J., & Nyberg, L. (2025). Pattern Mixture Sensitivity Analyses via Multiple Imputations for Non‐Ignorable Dropout in Joint Modeling of Cognition and Risk of Dementia. Wiley. https://doi.org/10.1002/sim.70040
Chicago Style (17th ed.) CitationGorbach, Tetiana, James R. Carpenter, Chris Frost, Maria Josefsson, Jennifer Nicholas, and Lars Nyberg. Pattern Mixture Sensitivity Analyses via Multiple Imputations for Non‐Ignorable Dropout in Joint Modeling of Cognition and Risk of Dementia. Wiley, 2025. https://doi.org/10.1002/sim.70040.
MLA (9th ed.) CitationGorbach, Tetiana, et al. Pattern Mixture Sensitivity Analyses via Multiple Imputations for Non‐Ignorable Dropout in Joint Modeling of Cognition and Risk of Dementia. Wiley, 2025. https://doi.org/10.1002/sim.70040.