Delta4Ms: Improving mutation‐based fault localization by eliminating mutant bias

Fuente: Wiley Open Access

Saved in:

Bibliographic Details
Main Authors:	Hengyuan Liu, Zheng Li, Baolong Han, Yangtao Liu, Xiang Chen, Yong Liu
Format:	Artículo Open Access
Published:	Wiley 2024
Subjects:	Software Testing, Verification and Reliability
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet