Skip to content
Descubridor Institucional UMAR
Inicio
Búsqueda avanzada
Explorar
Inicio
Búsqueda avanzada
Explorar
Login
Language
English
Deutsch
Español
Français
Italiano
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
PSC‐SBFL: Combining PSC With SBFL to Improve Software Fault Localization
PSC‐SBFL: Combining PSC With SBFL to Improve Software Fault Localization
Fuente:
Wiley Open Access
Saved in:
Bibliographic Details
Main Authors:
Zhonghao Guo
,
Siwei Ji
,
Xinyue Xu
,
Xiangxian Chen
Format:
Artículo Open Access
Published:
Wiley
2025
Subjects:
Software Testing, Verification and Reliability
Online Access:
Acceder al recurso
Tags:
Add Tag
No Tags, Be the first to tag this record!
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Save to List
Permanent link
Holdings
Description
Comments
Similar Items
Staff View
Internet
https://onlinelibrary.wiley.com/doi/10.1002/stvr.70007
Similar Items
A Systematic Exploration of Mutation‐Based Fault Localization Formulae
by: Bo Wang, et al.
Published: (2024)
SegTest: Metamorphic Testing of Image Segmentation via Guided Instance‐Level Test Data Augmentation
by: Zhonghao Hou, et al.
Published: (2024)
Mobile Open‐Source Software Reliability Growth Model Based on Extended Weibull Distribution and Introduced Faults With Multiple Change‐Points
by: Jinyong Wang, et al.
Published: (2026)
HGA: Heuristic Black‐Box Test Case Generation for NLP Intelligent Software
by: Mingxuan Xiao, et al.
Published: (2026)
Fault tolerance and metamorphic relation prediction
by: Yves Le Traon, et al.
Published: (2024)