Fault Tracing of Transformer Substation Devices via Event Graph Kernel

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Weizhuo Yao, Changjiang Ju, Genke Yang, Jian Chu
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	IEEJ Transactions on Electrical and Electronic Engineering
Online Access:	Acceder al recurso
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