Stiff TiN Network in Si 3 N 4 : Achieving High Strength, Toughness, and EMI Shielding

Fuente: Wiley Open Access
Saved in:
Bibliographic Details
Main Authors: Baokuo Nie, Xinghua Shen, Tongyang Li, Yuan Yu, Lujie Wang, Huaguo Tang, Zhuhui Qiao
Format: Artículo Open Access
Published: Wiley 2026
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items