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Detecting charge transfer at defects in 2D materials with electron ptychography
Detecting charge transfer at defects in 2D materials with electron ptychography
Fuente:
Wiley Open Access
Saved in:
Bibliographic Details
Main Authors:
Christoph Hofer
,
Jacob Madsen
,
Toma Susi
,
Timothy J. Pennycook
Format:
Artículo Open Access
Published:
Wiley
2025
Subjects:
Journal of Microscopy
Online Access:
Acceder al recurso
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