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Application of STEM tomography to investigate smooth ER morphology under stress conditions
Application of STEM tomography to investigate smooth ER morphology under stress conditions
Fuente:
Wiley Open Access
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Bibliographic Details
Main Authors:
V. Heinz
,
R. Rachel
,
C. Ziegler
Format:
Artículo Open Access
Published:
Wiley
2025
Subjects:
Journal of Microscopy
Online Access:
Acceder al recurso
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