Flash electropolishing for TEM: Reducing FIB‐induced defects in tungsten with protocols for new materials #

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Yan‐Ru Lin, Weicheng Zhong, Sabrina E. Calzada, Timothy G. Lach, Lauren J. Nuckols, Chad M. Parish, Steven J. Zinkle, M. Grace Burke
Format:	Artículo Open Access
Published:	Wiley 2026
Subjects:	Journal of Microscopy
Online Access:	Acceder al recurso
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