Fine Mapping of the All‐Stage Stripe Rust Resistance Gene Yr4EL and Its Utilization in Wheat Resistance Breeding

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Biran Gong, Hao Zhang, Yuxing Lu, Linfeng Chen, Wei Zhu, Lili Xu, Dandan Wu, Yiran Cheng, Yi Wang, Jian Zeng, Xing Fan, Lina Sha, Haiqin Zhang, Guoyue Chen, Yonghong Zhou, Yinghui Li, Houyang Kang
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	Plant, Cell & Environment
Online Access:	Acceder al recurso
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