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Skin patch based makeup finish assessment technique by deep neural network
Skin patch based makeup finish assessment technique by deep neural network
Fuente:
Wiley Open Access
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Bibliographic Details
Main Author:
Ken Nishino
Format:
Artículo Open Access
Published:
Wiley
2024
Subjects:
Skin Research and Technology
Online Access:
Acceder al recurso
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DOI:
10.1111/srt.13561
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