| _version_ | 1866901208434737152 |
|---|---|
| author | Sánchez-Agudo, Marta Génova, Inés Orr, Henry Harris, G Pérez, Gloria |
| author_facet | Sánchez-Agudo, Marta Génova, Inés Orr, Henry Harris, G Pérez, Gloria |
| contents | <p>This study investigates the physical and optical properties of ZnS thin films deposited under different evaporation conditions. ZnS films with a thickness of 3000 nm were grown on Ge substrates at substrate temperatures of 200 °C, 120 °C, and without intentional heating, using evaporation rates of 4, 2, and 1 nm/s. Structural and morphological characteristics were examined by X-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. The refractive index in the 2.4–11.5 µm spectral range was determined from transmittance spectra using reverse synthesis analysis.</p> <p>Based on these results, the optimal evaporation parameters were identified according to film properties and their suitability for thermal infrared (IR) multilayer coating applications. The adhesion performance of ZnS films deposited under optimized conditions was subsequently evaluated. Films grown at 120 °C and 4 nm/s failed the MIL-F-48616 surface durability test due to peeling. To improve adhesion, a MgO bonding interlayer was introduced, and its influence on ZnS film properties was assessed. The incorporation of the MgO layer significantly enhanced film adherence, and the mechanical stability of the ZnS coatings under MIL-F-48616 testing was successfully demonstrated for films deposited on MgO-coated substrates.</p> |
| format | Recurso digital |
| id | zenodo_https___doi_org_10_1117_12_797413 |
| institution | Zenodo |
| language | |
| publishDate | 2026 |
| publisher | Zenodo |
| record_format | zenodo |
| spellingShingle | ZnS films for infrared optical coatings: improvement of adhesion to Ge substrates Sánchez-Agudo, Marta Génova, Inés Orr, Henry Harris, G Pérez, Gloria <p>This study investigates the physical and optical properties of ZnS thin films deposited under different evaporation conditions. ZnS films with a thickness of 3000 nm were grown on Ge substrates at substrate temperatures of 200 °C, 120 °C, and without intentional heating, using evaporation rates of 4, 2, and 1 nm/s. Structural and morphological characteristics were examined by X-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. The refractive index in the 2.4–11.5 µm spectral range was determined from transmittance spectra using reverse synthesis analysis.</p> <p>Based on these results, the optimal evaporation parameters were identified according to film properties and their suitability for thermal infrared (IR) multilayer coating applications. The adhesion performance of ZnS films deposited under optimized conditions was subsequently evaluated. Films grown at 120 °C and 4 nm/s failed the MIL-F-48616 surface durability test due to peeling. To improve adhesion, a MgO bonding interlayer was introduced, and its influence on ZnS film properties was assessed. The incorporation of the MgO layer significantly enhanced film adherence, and the mechanical stability of the ZnS coatings under MIL-F-48616 testing was successfully demonstrated for films deposited on MgO-coated substrates.</p> |
| title | ZnS films for infrared optical coatings: improvement of adhesion to Ge substrates |
| url | https://doi.org/10.1117/12.797413 |