Sensitive detection of Si3N4 thin-film defects via second harmonic generation microscopy

Fuente: Zenodo

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Bibliographic Details
Main Authors:	Lukeš, Jakub, Hájková, Věra, Hlubučková, Martina, Kanclíř, Vít, Žídek, Karel
Format:	Recurso digital
Language:	English
Published:	Zenodo 2025
Online Access:	Acceder al recurso
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Internet

https://doi.org/10.1364/OL.553380