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2023
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| Online Access: | https://doi.org/10.5281/zenodo.14653997 |
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| author | Romano, Francesco Paolo Caliri, Claudia Ravan, Eva Luna miliani, costanza |
| author_facet | Romano, Francesco Paolo Caliri, Claudia Ravan, Eva Luna miliani, costanza |
| contents | <p>A novel MA-XRD/MA-XRF scanner for pigment-specific mapping of paintings </p> <p>Francesco Paolo Romano(1), Costanza Miliani(1), Claudia Caliri(1), Claudia <br>Fatuzzo(1), Giulia Privitera(2,3), Eva Luna Ravan(1,4), Dario Zappalà(1), Zdenek <br>Preisler(1) </p> <p>(1) CNR-ISPC, Via Biblioteca 4, 95124 Catania, Italy<br>(2) INFN-LNS, Via Santa Sofia 62, 95123, Catania, Italy<br>(3) DFA, University of Catania, Via Santa Sofia 64, 95123, Catania, Italy<br>(4) “La Sapienza” University of Rome, P.le Aldo Moro 5, 00185, Rome, Italy</p> <p>Pigments often present a polycrystalline nature and X-ray powder diffraction (XRPD) can be <br>used for their direct identification even in the case of complex mixtures. <br>This work presents a novel MA-XRD/MA-XRF system developed at the XRAYLab of ISPC<br>CNR in Catania. The main component of the device is a measurement-head consisting of a <br>microfocus Cu-anode source coupled to a slightly focusing polycapillary and two X-ray <br>detectors for recording both XRD patterns and XRF spectra simultaneously on the same <br>irradiated spot. A mechatronic device moves the measurement-head in 1mm steps along the XY <br>directions. A total area of 50x50cm2 can be covered in one scan. A laser distance sensor <br>controls an ancillary Z axis to keep the focus position pixel-by-pixel during the scanning <br>allowing us to measure paintings even with an irregular morphology. The device operates XRD <br>measurements in a parafocusing geometry. Diffraction patterns are collected in one-shot with a <br>1D microstrip single-photon-counting detector covering an angular range of 16-44deg (2θ). <br>Angular resolution in the diffraction patterns is about 0.25deg and typical dwell-time per pixel <br>is about 3s. In parallel, a SDD detector collects the fluorescence spectra on the same irradiated <br>spot allowing to combine XRF and XRD distribution maps during the analysis. <br>For one scanning session several tens of thousands of XRD patterns are recorded. Given the <br>number of patterns, a manual analysis of the full dataset is not feasible. Hence, we have modeled <br>the measurement geometry and we have developed a custom-built minimization routine for the <br>automatic pixel-per-pixel analysis including theta-shift correction, XRD pattern calibration and <br>crystalline phase identification. MA-XRF data are used to inform the analysis during the search<br>match procedure of the crystalline phases. Finally, we have extended the analytical <br>methodology to determine the crystalline phases distribution even for stratigraphic samples, as <br>in the case of paintings. Some results on compelling application in painting analysis are <br>presented and discussed.</p> |
| format | Recurso digital |
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| publishDate | 2023 |
| publisher | Zenodo |
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| spellingShingle | A novel MA-XRD/MA-XRF scanner for pigment-specific mapping of paintings Romano, Francesco Paolo Caliri, Claudia Ravan, Eva Luna miliani, costanza <p>A novel MA-XRD/MA-XRF scanner for pigment-specific mapping of paintings </p> <p>Francesco Paolo Romano(1), Costanza Miliani(1), Claudia Caliri(1), Claudia <br>Fatuzzo(1), Giulia Privitera(2,3), Eva Luna Ravan(1,4), Dario Zappalà(1), Zdenek <br>Preisler(1) </p> <p>(1) CNR-ISPC, Via Biblioteca 4, 95124 Catania, Italy<br>(2) INFN-LNS, Via Santa Sofia 62, 95123, Catania, Italy<br>(3) DFA, University of Catania, Via Santa Sofia 64, 95123, Catania, Italy<br>(4) “La Sapienza” University of Rome, P.le Aldo Moro 5, 00185, Rome, Italy</p> <p>Pigments often present a polycrystalline nature and X-ray powder diffraction (XRPD) can be <br>used for their direct identification even in the case of complex mixtures. <br>This work presents a novel MA-XRD/MA-XRF system developed at the XRAYLab of ISPC<br>CNR in Catania. The main component of the device is a measurement-head consisting of a <br>microfocus Cu-anode source coupled to a slightly focusing polycapillary and two X-ray <br>detectors for recording both XRD patterns and XRF spectra simultaneously on the same <br>irradiated spot. A mechatronic device moves the measurement-head in 1mm steps along the XY <br>directions. A total area of 50x50cm2 can be covered in one scan. A laser distance sensor <br>controls an ancillary Z axis to keep the focus position pixel-by-pixel during the scanning <br>allowing us to measure paintings even with an irregular morphology. The device operates XRD <br>measurements in a parafocusing geometry. Diffraction patterns are collected in one-shot with a <br>1D microstrip single-photon-counting detector covering an angular range of 16-44deg (2θ). <br>Angular resolution in the diffraction patterns is about 0.25deg and typical dwell-time per pixel <br>is about 3s. In parallel, a SDD detector collects the fluorescence spectra on the same irradiated <br>spot allowing to combine XRF and XRD distribution maps during the analysis. <br>For one scanning session several tens of thousands of XRD patterns are recorded. Given the <br>number of patterns, a manual analysis of the full dataset is not feasible. Hence, we have modeled <br>the measurement geometry and we have developed a custom-built minimization routine for the <br>automatic pixel-per-pixel analysis including theta-shift correction, XRD pattern calibration and <br>crystalline phase identification. MA-XRF data are used to inform the analysis during the search<br>match procedure of the crystalline phases. Finally, we have extended the analytical <br>methodology to determine the crystalline phases distribution even for stratigraphic samples, as <br>in the case of paintings. Some results on compelling application in painting analysis are <br>presented and discussed.</p> |
| title | A novel MA-XRD/MA-XRF scanner for pigment-specific mapping of paintings |
| url | https://doi.org/10.5281/zenodo.14653997 |