| _version_ | 1866901938719686656 |
|---|---|
| author | Vannucchi, Paola Ujiie, Kohtaro Stroncik, Nicole A. Malinverno, Alberto Arroyo, Ivonne G. Barckhausen, Udo Conin, Marianne Foley, Susan Murr Formolo, Michael J. Harris, Robert N. Heuret, Arnauld Huftile, Gary Kameda, Jun Kim, Gil Young Kutterolf, Steffen O. Martino, Amanda J. McCay, Gillian A. Nuzzo, Marianne Ohkushi, Ken'ichi Saito, Saneatsu Sak, Peter B. Solomon, Evan A. Stipp, Michael Torres, Marta E. Tsutsumi, Akito Uno, Masaoki Usui, Yoichi Vadakkeyakath, Yatheesh Yamamoto, Yuzuru Zhao, Xixi Zhu, Junjiang |
| author_facet | Vannucchi, Paola Ujiie, Kohtaro Stroncik, Nicole A. Malinverno, Alberto Arroyo, Ivonne G. Barckhausen, Udo Conin, Marianne Foley, Susan Murr Formolo, Michael J. Harris, Robert N. Heuret, Arnauld Huftile, Gary Kameda, Jun Kim, Gil Young Kutterolf, Steffen O. Martino, Amanda J. McCay, Gillian A. Nuzzo, Marianne Ohkushi, Ken'ichi Saito, Saneatsu Sak, Peter B. Solomon, Evan A. Stipp, Michael Torres, Marta E. Tsutsumi, Akito Uno, Masaoki Usui, Yoichi Vadakkeyakath, Yatheesh Yamamoto, Yuzuru Zhao, Xixi Zhu, Junjiang |
| contents | X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG). |
| format | Recurso digital |
| id | zenodo_https___doi_org_10_5281_zenodo_15604478 |
| institution | Zenodo |
| language | |
| publishDate | 2012 |
| publisher | Zenodo |
| record_format | zenodo |
| spellingShingle | IODP Expedition 334 X-ray diffraction (XRD) Vannucchi, Paola Ujiie, Kohtaro Stroncik, Nicole A. Malinverno, Alberto Arroyo, Ivonne G. Barckhausen, Udo Conin, Marianne Foley, Susan Murr Formolo, Michael J. Harris, Robert N. Heuret, Arnauld Huftile, Gary Kameda, Jun Kim, Gil Young Kutterolf, Steffen O. Martino, Amanda J. McCay, Gillian A. Nuzzo, Marianne Ohkushi, Ken'ichi Saito, Saneatsu Sak, Peter B. Solomon, Evan A. Stipp, Michael Torres, Marta E. Tsutsumi, Akito Uno, Masaoki Usui, Yoichi Vadakkeyakath, Yatheesh Yamamoto, Yuzuru Zhao, Xixi Zhu, Junjiang Integrated Ocean Drilling Program IODP JOIDES Resolution Expedition 334 Expedition 344 Site U1378 Site U1379 Site U1380 Site U1381 Costa Rica Seismogenesis Project CRISP Deep biosphere Cocos Ridge microearthquakes Central American Volcanic arc X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG). |
| title | IODP Expedition 334 X-ray diffraction (XRD) |
| topic | Integrated Ocean Drilling Program IODP JOIDES Resolution Expedition 334 Expedition 344 Site U1378 Site U1379 Site U1380 Site U1381 Costa Rica Seismogenesis Project CRISP Deep biosphere Cocos Ridge microearthquakes Central American Volcanic arc |
| url | https://doi.org/10.5281/zenodo.15604478 |