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author Vannucchi, Paola
Ujiie, Kohtaro
Stroncik, Nicole A.
Malinverno, Alberto
Arroyo, Ivonne G.
Barckhausen, Udo
Conin, Marianne
Foley, Susan Murr
Formolo, Michael J.
Harris, Robert N.
Heuret, Arnauld
Huftile, Gary
Kameda, Jun
Kim, Gil Young
Kutterolf, Steffen O.
Martino, Amanda J.
McCay, Gillian A.
Nuzzo, Marianne
Ohkushi, Ken'ichi
Saito, Saneatsu
Sak, Peter B.
Solomon, Evan A.
Stipp, Michael
Torres, Marta E.
Tsutsumi, Akito
Uno, Masaoki
Usui, Yoichi
Vadakkeyakath, Yatheesh
Yamamoto, Yuzuru
Zhao, Xixi
Zhu, Junjiang
author_facet Vannucchi, Paola
Ujiie, Kohtaro
Stroncik, Nicole A.
Malinverno, Alberto
Arroyo, Ivonne G.
Barckhausen, Udo
Conin, Marianne
Foley, Susan Murr
Formolo, Michael J.
Harris, Robert N.
Heuret, Arnauld
Huftile, Gary
Kameda, Jun
Kim, Gil Young
Kutterolf, Steffen O.
Martino, Amanda J.
McCay, Gillian A.
Nuzzo, Marianne
Ohkushi, Ken'ichi
Saito, Saneatsu
Sak, Peter B.
Solomon, Evan A.
Stipp, Michael
Torres, Marta E.
Tsutsumi, Akito
Uno, Masaoki
Usui, Yoichi
Vadakkeyakath, Yatheesh
Yamamoto, Yuzuru
Zhao, Xixi
Zhu, Junjiang
contents X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG).
format Recurso digital
id zenodo_https___doi_org_10_5281_zenodo_15604478
institution Zenodo
language
publishDate 2012
publisher Zenodo
record_format zenodo
spellingShingle IODP Expedition 334 X-ray diffraction (XRD)
Vannucchi, Paola
Ujiie, Kohtaro
Stroncik, Nicole A.
Malinverno, Alberto
Arroyo, Ivonne G.
Barckhausen, Udo
Conin, Marianne
Foley, Susan Murr
Formolo, Michael J.
Harris, Robert N.
Heuret, Arnauld
Huftile, Gary
Kameda, Jun
Kim, Gil Young
Kutterolf, Steffen O.
Martino, Amanda J.
McCay, Gillian A.
Nuzzo, Marianne
Ohkushi, Ken'ichi
Saito, Saneatsu
Sak, Peter B.
Solomon, Evan A.
Stipp, Michael
Torres, Marta E.
Tsutsumi, Akito
Uno, Masaoki
Usui, Yoichi
Vadakkeyakath, Yatheesh
Yamamoto, Yuzuru
Zhao, Xixi
Zhu, Junjiang
Integrated Ocean Drilling Program
IODP
JOIDES Resolution
Expedition 334
Expedition 344
Site U1378
Site U1379
Site U1380
Site U1381
Costa Rica Seismogenesis Project
CRISP
Deep biosphere
Cocos Ridge
microearthquakes
Central American Volcanic arc
X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG).
title IODP Expedition 334 X-ray diffraction (XRD)
topic Integrated Ocean Drilling Program
IODP
JOIDES Resolution
Expedition 334
Expedition 344
Site U1378
Site U1379
Site U1380
Site U1381
Costa Rica Seismogenesis Project
CRISP
Deep biosphere
Cocos Ridge
microearthquakes
Central American Volcanic arc
url https://doi.org/10.5281/zenodo.15604478