| _version_ | 1866902336106921984 |
|---|---|
| author | Erfan, Mazen |
| author_facet | Erfan, Mazen |
| contents | <p>AI-Enabled Optical Inspection of Microoptics Integration with Photonic MEMS Chips for Wideband FTIR Spectroscopy<br>Ali Khater1, Ahmed Abdelkhalek1, Mohamed Metwally1, Omar El Nahhas1, Mohamed Ismail1, Hoda El Gibally1, Ahmed Mostafa1, Mazen Erfan2,3, Mohamed H. Al Haron1, Bassem Mortada1, Momen Anwar1, Yasser M. Sabry1,3<br>1. Si-Ware Systems, 3 Khalid Ibn Al-Waleed St., 11361 Heliopolis, Cairo, Egypt<br>2. Si-Ware Systems SAS, 16 rue Portalis, 75008 Paris, France<br>3. Faculty of Engineering, Ain-Shams University, 1 Elsarayat St., 11535 Abbaseya, Cairo, Egypt</p> |
| format | Recurso digital |
| id | zenodo_https___doi_org_10_5281_zenodo_15968024 |
| institution | Zenodo |
| language | |
| publishDate | 2025 |
| publisher | Zenodo |
| record_format | zenodo |
| spellingShingle | AI-Enabled Optical Inspection of Microoptics Integration with Photonic MEMS Chips for Wideband FTIR Spectroscopy Erfan, Mazen <p>AI-Enabled Optical Inspection of Microoptics Integration with Photonic MEMS Chips for Wideband FTIR Spectroscopy<br>Ali Khater1, Ahmed Abdelkhalek1, Mohamed Metwally1, Omar El Nahhas1, Mohamed Ismail1, Hoda El Gibally1, Ahmed Mostafa1, Mazen Erfan2,3, Mohamed H. Al Haron1, Bassem Mortada1, Momen Anwar1, Yasser M. Sabry1,3<br>1. Si-Ware Systems, 3 Khalid Ibn Al-Waleed St., 11361 Heliopolis, Cairo, Egypt<br>2. Si-Ware Systems SAS, 16 rue Portalis, 75008 Paris, France<br>3. Faculty of Engineering, Ain-Shams University, 1 Elsarayat St., 11535 Abbaseya, Cairo, Egypt</p> |
| title | AI-Enabled Optical Inspection of Microoptics Integration with Photonic MEMS Chips for Wideband FTIR Spectroscopy |
| url | https://doi.org/10.5281/zenodo.15968024 |