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Main Author: SHI, Qiwei
Format: Recurso digital
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Published: Zenodo 2025
Online Access:https://doi.org/10.5281/zenodo.17034117
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author SHI, Qiwei
author_facet SHI, Qiwei
contents <p> </p> <pre>600 high definition (1140×1600 pixels) diffraction patterns recorded by Bruker EBSD detector for annealed and 10%-rolled AlMg samples are provided, resolved at a step size of 1.62μm and 6.87μm, respectively. The acceleration voltage was 20 kV, the probe current 20 nA, and the dwell time 1 s.</pre> <p>These patterns were analyzed in previous publications (https://doi.org/10.1016/j.matchar.2021.111206, https://doi.org/10.1016/j.micron.2021.103081, https://doi.org/10.1016/j.matchar.2023.113022, https://doi.org/10.1016/j.matchar.2024.114508).</p> <p>The full field dislocation density maps for the two scans, estimated by the blurriness of the patterns, are also available.</p>
format Recurso digital
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publishDate 2025
publisher Zenodo
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spellingShingle High-definition electron backscatter diffraction patterns of annealed and 10%-rolled AlMg alloys
SHI, Qiwei
<p> </p> <pre>600 high definition (1140×1600 pixels) diffraction patterns recorded by Bruker EBSD detector for annealed and 10%-rolled AlMg samples are provided, resolved at a step size of 1.62μm and 6.87μm, respectively. The acceleration voltage was 20 kV, the probe current 20 nA, and the dwell time 1 s.</pre> <p>These patterns were analyzed in previous publications (https://doi.org/10.1016/j.matchar.2021.111206, https://doi.org/10.1016/j.micron.2021.103081, https://doi.org/10.1016/j.matchar.2023.113022, https://doi.org/10.1016/j.matchar.2024.114508).</p> <p>The full field dislocation density maps for the two scans, estimated by the blurriness of the patterns, are also available.</p>
title High-definition electron backscatter diffraction patterns of annealed and 10%-rolled AlMg alloys
url https://doi.org/10.5281/zenodo.17034117