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| Format: | Recurso digital |
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Zenodo
2025
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| Online Access: | https://doi.org/10.5281/zenodo.17034117 |
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Table of Contents:
- <p> </p> <pre>600 high definition (1140×1600 pixels) diffraction patterns recorded by Bruker EBSD detector for annealed and 10%-rolled AlMg samples are provided, resolved at a step size of 1.62μm and 6.87μm, respectively. The acceleration voltage was 20 kV, the probe current 20 nA, and the dwell time 1 s.</pre> <p>These patterns were analyzed in previous publications (https://doi.org/10.1016/j.matchar.2021.111206, https://doi.org/10.1016/j.micron.2021.103081, https://doi.org/10.1016/j.matchar.2023.113022, https://doi.org/10.1016/j.matchar.2024.114508).</p> <p>The full field dislocation density maps for the two scans, estimated by the blurriness of the patterns, are also available.</p>