Raw data for Transmission electron microscopy analysis of the microstructure of nanocrystalline small-molecule semiconductors in functional organic thin-film transistors

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Autor principal: Hettler, Simon
Formato: Recurso digital
Lenguaje:inglés
Publicado: Zenodo 2025
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_version_ 1866901959869464576
author Hettler, Simon
author_facet Hettler, Simon
contents <p>Raw data for the paper "Transmission electron microscopy analysis of the microstructure of small-molecule semiconductors in functional organic thin-film transistors"</p>
format Recurso digital
id zenodo_https___doi_org_10_5281_zenodo_17344166
institution Zenodo
language eng
publishDate 2025
publisher Zenodo
record_format zenodo
spellingShingle Raw data for Transmission electron microscopy analysis of the microstructure of nanocrystalline small-molecule semiconductors in functional organic thin-film transistors
Hettler, Simon
Microscopy, Electron, Transmission
<p>Raw data for the paper "Transmission electron microscopy analysis of the microstructure of small-molecule semiconductors in functional organic thin-film transistors"</p>
title Raw data for Transmission electron microscopy analysis of the microstructure of nanocrystalline small-molecule semiconductors in functional organic thin-film transistors
topic Microscopy, Electron, Transmission
url https://doi.org/10.5281/zenodo.17344166