Test of the final ultra-thin hybrid assemblies from wafer-to-wafer bonding

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Autores principales: Hügging, Fabian, Fritzsch, T, Dieter, Y, Weingärtner, Julian, Vischer, J
Formato: Recurso digital
Publicado: Zenodo 2025
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WP6
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author Hügging, Fabian
Fritzsch, T
Dieter, Y
Weingärtner, Julian
Vischer, J
author_facet Hügging, Fabian
Fritzsch, T
Dieter, Y
Weingärtner, Julian
Vischer, J
contents <p><span>This deliverable report summarizes the <span>results</span> of test structures developed within technologies for wafer-to-wafer hybridization. This effort resulted in demonstration that this approach is feasible for radiation sensors and FE electronics as used for hybrid pixel detectors although a final prototype with real pixel and FE electronics could not yet be achieved within the time frame of the project. </span></p> <p><span> </span></p>
format Recurso digital
id zenodo_https___doi_org_10_5281_zenodo_17698520
institution Zenodo
language
publishDate 2025
publisher Zenodo
record_format zenodo
spellingShingle Test of the final ultra-thin hybrid assemblies from wafer-to-wafer bonding
Hügging, Fabian
Fritzsch, T
Dieter, Y
Weingärtner, Julian
Vischer, J
WP6
<p><span>This deliverable report summarizes the <span>results</span> of test structures developed within technologies for wafer-to-wafer hybridization. This effort resulted in demonstration that this approach is feasible for radiation sensors and FE electronics as used for hybrid pixel detectors although a final prototype with real pixel and FE electronics could not yet be achieved within the time frame of the project. </span></p> <p><span> </span></p>
title Test of the final ultra-thin hybrid assemblies from wafer-to-wafer bonding
topic WP6
url https://doi.org/10.5281/zenodo.17698520