Benefits of On-wafer Calibration for RF Characterization of InP DHBT Technology Devices

Fuente: Zenodo

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Bibliographic Details
Main Authors:	CISSE, Moussa, Davy, Nil, Nodjiadjim, Virginie, Ardouin, Bertrand, Mismer, Colin, Maneux, Cristell, Marc, Franc¸ois, Deng, Marina
Format:	Recurso digital
Language:	English
Published:	Zenodo 2025
Subjects:	RF on-wafer characterization. calibration openshort de-embedding EM simulation bipolar transistors indium phosphide (InP)
Online Access:	Acceder al recurso
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