Benefits of On-wafer Calibration for RF Characterization of InP DHBT Technology Devices
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Zenodo
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| Main Authors: | CISSE, Moussa, Davy, Nil, Nodjiadjim, Virginie, Ardouin, Bertrand, Mismer, Colin, Maneux, Cristell, Marc, Franc¸ois, Deng, Marina |
|---|---|
| Format: | Recurso digital |
| Language: | English |
| Published: |
Zenodo
2025
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