Scanning Electron Microscopy Datasets for Industrial Defect Detection

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Auteur principal: Author, Anonymous
Format: Recurso digital
Publié: Zenodo 2026
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author Author, Anonymous
author_facet Author, Anonymous
contents
format Recurso digital
id zenodo_https___doi_org_10_5281_zenodo_18266856
institution Zenodo
language
publishDate 2026
publisher Zenodo
record_format zenodo
spellingShingle Scanning Electron Microscopy Datasets for Industrial Defect Detection
Author, Anonymous

title Scanning Electron Microscopy Datasets for Industrial Defect Detection
url https://doi.org/10.5281/zenodo.18266856