Kumar, R. (2026). Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance. Zenodo.
Style de citation Chicago (17e éd.)Kumar, Roopesh. Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance. Zenodo, 2026.
Style de citation MLA (9e éd.)Kumar, Roopesh. Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance. Zenodo, 2026.
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