Kumar, R. (2026). Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance. Zenodo.
Citazione stile Chigago Style (17a edizione)Kumar, Roopesh. Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance. Zenodo, 2026.
Citatione MLA (9a ed.)Kumar, Roopesh. Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance. Zenodo, 2026.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.