APA (7th ed.) Citation

Kumar, R. (2026). Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance. Zenodo.

Chicago Style (17th ed.) Citation

Kumar, Roopesh. Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance. Zenodo, 2026.

MLA (9th ed.) Citation

Kumar, Roopesh. Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance. Zenodo, 2026.

Warning: These citations may not always be 100% accurate.