Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance
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| Format: | Recurso digital |
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Zenodo
2026
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| _version_ | 1866901479191740416 |
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| author | Kumar, Roopesh |
| author_facet | Kumar, Roopesh |
| contents | |
| format | Recurso digital |
| id | zenodo_https___doi_org_10_5281_zenodo_18439503 |
| institution | Zenodo |
| language | |
| publishDate | 2026 |
| publisher | Zenodo |
| record_format | zenodo |
| spellingShingle | Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance Kumar, Roopesh |
| title | Synthetic Defect Data Generation Using Deep Learning Architecture for Improved Wafer Inspection Performance |
| url | https://doi.org/10.5281/zenodo.18439503 |