Saved in:
| Main Author: | Kumar, Roopesh |
|---|---|
| Format: | Recurso digital |
| Language: | |
| Published: |
Zenodo
2026
|
| Online Access: | https://doi.org/10.5281/zenodo.18439503 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
WaferSAGE: Large Language Model-Powered Wafer Defect Analysis via Synthetic Data Generation and Rubric-Guided Reinforcement Learning
by: Xu, Ke, et al.
Published: (2026)
by: Xu, Ke, et al.
Published: (2026)
Synthetic Defect Image Generation for Power Line Insulator Inspection Using Multimodal Large Language Models
by: Wang, Xuesong, et al.
Published: (2026)
by: Wang, Xuesong, et al.
Published: (2026)
Integrating Artificial Intelligence Models and Synthetic Image Data for Enhanced Asset Inspection and Defect Identification
by: Mandati, Reddy, et al.
Published: (2024)
by: Mandati, Reddy, et al.
Published: (2024)
Defect Detection in Photolithographic Patterns Using Deep Learning Models Trained on Synthetic Data
by: Shinde, Prashant P., et al.
Published: (2025)
by: Shinde, Prashant P., et al.
Published: (2025)
A Hybrid Vision-Language Architecture for Automated Defect Reasoning and Report Generation in Industrial Inspection
by: Malikussaid, et al.
Published: (2026)
by: Malikussaid, et al.
Published: (2026)
synth-dacl: Does Synthetic Defect Data Enhance Segmentation Accuracy and Robustness for Real-World Bridge Inspections?
by: Flotzinger, Johannes, et al.
Published: (2025)
by: Flotzinger, Johannes, et al.
Published: (2025)
Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network
by: Bao, Yin-Yin, et al.
Published: (2024)
by: Bao, Yin-Yin, et al.
Published: (2024)
DefectFill: Realistic Defect Generation with Inpainting Diffusion Model for Visual Inspection
by: Song, Jaewoo, et al.
Published: (2025)
by: Song, Jaewoo, et al.
Published: (2025)
Green Nanoengineered Keratin Derived Bio‐Adsorbent for Heavy Metals Removal from Aqueous Media
by: Muhammad Zubair, et al.
Published: (2024)
by: Muhammad Zubair, et al.
Published: (2024)
Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection
by: Cantú, Emílio Dolgener, et al.
Published: (2025)
by: Cantú, Emílio Dolgener, et al.
Published: (2025)
Effects of Using Synthetic Data on Deep Recommender Models' Performance
by: Taskin, Fatih Cihan, et al.
Published: (2024)
by: Taskin, Fatih Cihan, et al.
Published: (2024)
Detecting Defective Wafers Via Modular Networks
by: Zhang, Yifeng, et al.
Published: (2025)
by: Zhang, Yifeng, et al.
Published: (2025)
Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects
by: Hu, Zhining, et al.
Published: (2024)
by: Hu, Zhining, et al.
Published: (2024)
Observational and Experimental Insights into Machine Learning-Based Defect Classification in Wafers
by: Taha, Kamal
Published: (2023)
by: Taha, Kamal
Published: (2023)
Human-in-the-Loop Synthetic Text Data Inspection with Provenance Tracking
by: Kang, Hong Jin, et al.
Published: (2024)
by: Kang, Hong Jin, et al.
Published: (2024)
An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection
by: Prasad, Amit, et al.
Published: (2024)
by: Prasad, Amit, et al.
Published: (2024)
Iterative Cluster Harvesting for Wafer Map Defect Patterns
by: Pleli, Alina, et al.
Published: (2024)
by: Pleli, Alina, et al.
Published: (2024)
Enhancing Thin-Film Wafer Inspection With A Multi-Sensor Array And Robot Constraint Maintenance
by: Sánchez-Arriaga, Néstor Eduardo, et al.
Published: (2025)
by: Sánchez-Arriaga, Néstor Eduardo, et al.
Published: (2025)
Generative Deep Learning and Signal Processing for Data Augmentation of Cardiac Auscultation Signals: Improving Model Robustness Using Synthetic Audio
by: Abbott, Leigh, et al.
Published: (2024)
by: Abbott, Leigh, et al.
Published: (2024)
An Incremental Unified Framework for Small Defect Inspection
by: Tang, Jiaqi, et al.
Published: (2023)
by: Tang, Jiaqi, et al.
Published: (2023)
Switch-Less Dragonfly on Wafers: A Scalable Interconnection Architecture based on Wafer-Scale Integration
by: Feng, Yinxiao, et al.
Published: (2024)
by: Feng, Yinxiao, et al.
Published: (2024)
Improved Generation of Synthetic Imaging Data Using Feature-Aligned Diffusion
by: Nair, Lakshmi
Published: (2024)
by: Nair, Lakshmi
Published: (2024)
Wafer Defect Root Cause Analysis with Partial Trajectory Regression
by: Miyaguchi, Kohei, et al.
Published: (2025)
by: Miyaguchi, Kohei, et al.
Published: (2025)
Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers
by: Mohammad, Faisal, et al.
Published: (2025)
by: Mohammad, Faisal, et al.
Published: (2025)
From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing
by: Jianyu Li, et al.
Published: (2026)
by: Jianyu Li, et al.
Published: (2026)
UniPCB: A Generation-Assisted Detection Framework for PCB Defect Inspection
by: Zhang, Huan, et al.
Published: (2026)
by: Zhang, Huan, et al.
Published: (2026)
DefectTwin: When LLM Meets Digital Twin for Railway Defect Inspection
by: Ferdousi, Rahatara, et al.
Published: (2024)
by: Ferdousi, Rahatara, et al.
Published: (2024)
Improving Pallet Detection Using Synthetic Data
by: Gann, Henry, et al.
Published: (2024)
by: Gann, Henry, et al.
Published: (2024)
Improving Machine Learning Performance with Synthetic Augmentation
by: Sohm, Mel, et al.
Published: (2026)
by: Sohm, Mel, et al.
Published: (2026)
Wind Turbine Feature Detection Using Deep Learning and Synthetic Data
by: Shahirpour, Arash, et al.
Published: (2025)
by: Shahirpour, Arash, et al.
Published: (2025)
Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS
by: Chen, Ying-Lin, et al.
Published: (2024)
by: Chen, Ying-Lin, et al.
Published: (2024)
Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images
by: Dey, Bappaditya, et al.
Published: (2024)
by: Dey, Bappaditya, et al.
Published: (2024)
Synthetic Survival Data Generation for Heart Failure Prognosis Using Deep Generative Models
by: Puttanawarut, Chanon, et al.
Published: (2025)
by: Puttanawarut, Chanon, et al.
Published: (2025)
Improving Clinical NLP Performance through Language Model-Generated Synthetic Clinical Data
by: Chen, Shan, et al.
Published: (2024)
by: Chen, Shan, et al.
Published: (2024)
A Protocol-Language Model for Network Intrusion (Without Deep Packet Inspection)
by: Sharma, Vivek Kumar
Published: (2026)
by: Sharma, Vivek Kumar
Published: (2026)
Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification
by: Mishra, Abhishek, et al.
Published: (2024)
by: Mishra, Abhishek, et al.
Published: (2024)
Super‐Resolution Microscopy for Precision Microsphere Defect Inspection Using Sparrow‐Optimized Autocorrelation Deconvolution
by: Tao He, et al.
Published: (2026)
by: Tao He, et al.
Published: (2026)
Deep Reinforcement Learning for Scalable Multiagent Spacecraft Inspection
by: Dunlap, Kyle, et al.
Published: (2024)
by: Dunlap, Kyle, et al.
Published: (2024)
SoftSRV: Learn to Generate Targeted Synthetic Data
by: DeSalvo, Giulia, et al.
Published: (2024)
by: DeSalvo, Giulia, et al.
Published: (2024)
Debiasing Synthetic Data Generated by Deep Generative Models
by: Decruyenaere, Alexander, et al.
Published: (2024)
by: Decruyenaere, Alexander, et al.
Published: (2024)
Similar Items
-
WaferSAGE: Large Language Model-Powered Wafer Defect Analysis via Synthetic Data Generation and Rubric-Guided Reinforcement Learning
by: Xu, Ke, et al.
Published: (2026) -
Synthetic Defect Image Generation for Power Line Insulator Inspection Using Multimodal Large Language Models
by: Wang, Xuesong, et al.
Published: (2026) -
Integrating Artificial Intelligence Models and Synthetic Image Data for Enhanced Asset Inspection and Defect Identification
by: Mandati, Reddy, et al.
Published: (2024) -
Defect Detection in Photolithographic Patterns Using Deep Learning Models Trained on Synthetic Data
by: Shinde, Prashant P., et al.
Published: (2025) -
A Hybrid Vision-Language Architecture for Automated Defect Reasoning and Report Generation in Industrial Inspection
by: Malikussaid, et al.
Published: (2026)